“An Analysis of Fault-Tolerant Dual-Core Lockstep Architectures and Soft Error Mitigation Strategies in High-Reliability Semiconductor Systems”, eigmj, vol. 3, no. 10, pp. 12–17, Oct. 2024, Accessed: Apr. 29, 2026. [Online]. Available: https://grpublishing.net/index.php/eigmj/article/view/122